The atomic force microscope (AFM) in this laboratory is a Thermomicroscopes Autoprobe CP Research AFM. The open architecture of this AFM allows easy access to the cantilever. This AFM has been modified to allow for various dynamic modes of operation to be investigated.
The linear and nonlinear vibrations of AFM cantilevers in contact with a specimen surface are exploited for the measurement of material properties with nanoscale resolution. An external function generator, a 200 MHz lock-in amplifier, a 200 MHz digital oscilloscope, and ultrasonic transducers are used in conjunction with the AFM.