The VK-X200K Series combines features of an optical microscope, roughness gauge, laser profilometer, and scanning electron microscope, our laser scanning confocal microscope performs non-contact surface profile, surface roughness, and thickness measurements without the need for sample preparation.
- Up to 28,800x magnification
- 0.5 nanometer Z-axis resolution on almost any material
- High-resolution, large depth-of-field observation
- Profile and roughness measurements with zero sample preparation
- Measures thickness and uniformity of clear layers
- No data loss - even on steep angles
Standard Operating Procedure (.pdf - 4 MB)
Image & Measurement Capabilities
- High-resolution, Large depth-of-field observation
High resolution, 24,000x magnification
Fully-focused image
- Rapid 3D color imaging
High-definition color image
No sample preparation
Measure samples of any size and nearly any material
- Non-destructive profile and roughness measurements
Height, width, angle measurement
Surface area and volume measurement
Line roughness measurement
Surface roughness measurement
Area film thickness measurement function
Automatic width and height measurement