The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes. The system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from the ST system provides a flexible tool for quality laboratories, production facilities and research departments.
Nikon Metrology X-ray sources are at the heart of our technology and have been designed and manufactured in-house from 1987 to this day; offering over 30 years of knowledge. Being at the heart of the image, control over the X-ray source technology allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. All sources are open-tube giving a low cost of ownership and range from low 180 kV to medium 225 kV to high 450 kV, all with micron resolution.
Standard Operating Procedure (.pdf)
Nikon Metrology X-ray sources are at the heart of our technology and have been designed and manufactured in-house from 1987 to this day; offering over 30 years of knowledge. Being at the heart of the image, control over the X-ray source technology allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. All sources are open-tube giving a low cost of ownership and range from low 180 kV to medium 225 kV to high 450 kV, all with micron resolution.
Standard Operating Procedure (.pdf)